Ina Schieferdecker
Fraunhofer Fokus [Germany]

In system engineering, testing is a generally accepted approach to validate systems and system components. Assured quality of system and system components is particularly important as the time-to-market become ever shorter and the requirements on system features, reliability, availability, integrity and performance further increase. A systematic approach to testing distributed systems is essential, so that the requirements of the market can be fulfilled.

The Testing and Test Control Notation TTCN-3, being the third edition of TTCN, has been developed by ETSI to address testing needs of modern Telco and IT technologies and to widen the scope of applicability. One of the objectives of TTCN-3 is to enable systematic, specification-based testing for software systems based e.g. on CORBA, EJB or XML technologies. This tutorial will discuss in particular the use of TTCN-3 for testing software systems.

Level of the tutorial
The level of the Tutorial will be between intermediate and advanced.
Audience: Anyone interested in automatic testing based on test specifications

Objectives of the tutorial
To present basic principles of systematic testing of software systems with TTCN-3. In particular, the testing of XML interfaces and Java classes are discussed and demonstrated practically.

Content of the tutorial
TTCN-3 is the modern and powerful test specification and test implementation language. Typical areas of application are protocol testing (including mobile and Internet protocols), service testing (including supplementary services), module testing, testing of CORBA based platforms, API testing etc. TTCN-3 is not restricted to conformance testing and can be used for many other kinds of testing including interoperability, robustness, regression, system and integration testing.

TTCN-3 is a language to define test procedures to be used for black-box testing of distributed systems. Stimuli are given to the system under test (SUT), its reactions are observed and compared with the expected ones. On the basis of this comparison, the subsequent test behaviour is determined or the test verdict is assigned. If expected and observed responses differ, then a fault has been discovered which is indicated by a test verdict fail. A successful test is indicated by a test verdict pass.

TTCN-3 allows an easy and efficient description of complex distributed test behaviour in terms of sequences, alternatives, loops and parallel stimuli and responses. Stimuli and responses are exchanged at the interfaces of the system under test, which are defined as a collection of ports. The test system can use a number of test components to perform test procedures in parallel. Likewise to the interfaces of the system under test, the interfaces of the test components are described as ports.

TTCN-3 is a modular language and has a similar look and feel to a typical programming language. However, in addition to the typical programming constructs, it contains all the important features necessary to specify test procedures and campaigns for functional, conformance, interoperability, load and scalability tests like test verdicts, matching mechanisms to compare the reactions of the SUT with the expected range of values, timer handling, distributed test components, ability to specify encoding information, synchronous and asynchronous communication, and monitoring.

A TTCN-3 test specification consists of four main parts:

The tutorial will give an introduction to TTCN-3 and discuss its main new features like

Afterwards, the tutorial will discuss the testing of software systems with TTCN-3. At first, the testing of XML interfaces is presented. The basic principles will be discussed. A mapping of XML schema onto the TTCN-3 type systems will be given in order to enable the automated derivation of test data from XML definitions. The implementation of such tests on the basis of protocols such as http or soap will be discussed.

phone:  +49 30 3463 7241
fax:    +49 30 3463 8241
Address:  FOKUS

Kaiserin-Augusta-Allee 31
D-10589 Berlin

Prof. Dr.-Ing. Ina Schieferdecker studied Mathematical Computer Science at Humboldt-University Berlin and did her PhD in 1994 at Technical University Berlin on performance-extended specifications and analysis of QoS characteristics. She had short research stays at ICSI, Berkeley, USA and CRIM, Montreal, Canada. Since 1997, she is heading the Competence Center Modeling and Testing (MOTION) at the Fraunhofer Institute on Open Communication Systems (FOKUS), Berlin. She is Professor on Engineering and Testing of Telecommunication Systems at Technical University Berlin since 2003. Prof. Schieferdecker works since 1994 in the area of design, analysis, testing and evaluation of communication systems using specification-based techniques like UML (Unified Modelling Language), MSC (Message Sequence Charts) and TTCN-3 (Testing and Test Control Notation). Frau Schieferdecker authored many scientific publications in the area of development and testing. She is an active member in the standardization of TTCN-3 by ETSI and of the UML 2.0 Testing Profile by OMG. She is among other things member of the German Testing Board and co-founder of the Testing Technologies IST GmbH, Berlin. She received in 2004 the Alfried Krupp von Bohlen and Halbach Award for Young Professors.


J. Zander, Z.R. Dai, I. Schieferdecker, G. Din: From U2TP Models to Executable Tests with TTCN-3 - An Approach to Model Driven Testing, IFIP 17th Intern. Conf. on Testing Communicating Systems - TestCom 2005, Montreal, Canada, March 2005.

I. Schieferdecker, A. Rennoch: Industrial use of TTCN-3 - Scope and Limits, International Conference on Software Tests, ICSTEST 2005, Düsseldorf, April 2005.

S. Burton, A. Baresel, I. Schieferdecker, Automated testing of automotive telematics systems using TTCN-3, 3rd Workshop on System Testing and Validation (SV04), Paris, December 2, 2004, Fraunhofer IRB Verlag, Stuttgart.

I. Schieferdecker, G. Din, D. Apostolidis: Distributed Functional and Load tests for Web services, International Journal on Software Tools for Technology Transfer (STTT), Springer 2004

I. Schieferdecker, G. Din: A Metamodel for TTCN-3, 1st International Workshop on Integration of Testing Methodologies ITM 2004, October 2004, Toledo, Spain, Springer, Lecture Notes in Computer Science 3236.

T. Vassiliou-Gioles, G. Din, I. Schieferdecker: Execution of External Applications using TTCN-3. IFIP 16th Intern. Conf. on Testing Communicating Systems - TestCom 2004, St Anne's College, Oxford, United Kingdom, March 2004, Springer, Lecture Notes in Computer Science 2978.

I. Schieferdecker , T. Vassiliou-Gioles: Tool Supported Test Frameworks in TTCN-3. \u2013 8th Intern. Workshop in Formal Methods in Industrial Critical Systems, Røros, Norway, June 2003, ENTCS (80), Elsevier Science.

I. Schieferdecker, T. Vassiliou-Gioles: Realizing distributed TTCN-3 test systems with TCI, IFIP 15th Intern. Conf. on Testing Communicating Systems - TestCom 2003, Sophia-Antipolis, France, May 2003, Springer, Lecture Notes in Computer Science 2644.

I. Schieferdecker, S. Pietsch, T. Vassiliou-Gioles: Systematic Testing of Internet Protocols - First Experiences in Using TTCN-3 for SIP. 5th IFIP Africom Conference on Communication Systems, Cape Town, South Africa, May 2001.

S. Schulz, T. Vassiliou-Gioles: Implementation of TTCN-3 Test Systems using the TRI. 14th IFIP International Workshop on Testing Communicating Systems' (Testcom 2002), Kluwer Academic Publishers, Berlin, March 2002.

M. Ebner, A. Yin, M.Li: A Definition and Utilization of OMG IDL to TTCN-3 Mappings. 14th IFIP International Workshop on Testing Communicating Systems' (Testcom 2002), Kluwer Academic Publishers, Berlin, March 2002.

J. Grabowski, Anthony Wiles, Colin Willcock, Dieter Hogrefe. On the Design of the new Testing Language TTCN-3. 13th IFIP International Workshop on Testing Communicating Systems' (Testcom 2000), Ottawa, 29.8.2000-1.9.2000, Kluwer Academic Publishers, August 2000.

J. Grabowski. TTCN-3 - A new Test Specification Language for Black-Box Testing of Distributed Systems.17th International Conference and Exposition on Testing Computer Software (TCS'2000), Theme: Testing Technology vs.Testers' Requirements, Washington D.C., June 2000.

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